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No 30, Station Road Workshops, BS15 4PJ Bristol, Avon  Show map  Hide map

Show me directions to NanoScope Services Ltd

Monday to Friday 08:30 - 17:30 Saturday to Sunday Closed

process control reliability Failure Analysis Electron Microscopes Scanning Electron scanning electron microscope Focused Ion Beam circuit modification TEM analysis Plastic Package Decapsulation

Business profile

Fast turnaround lab services for SEM, TEM & FIB (Focused Ion Beam)We offer advanced Circuit Edit, TEM sample prep, TEM Analysis, FIB cross sections for failure or process analysis, Non-destructive analysis, Nano machining, plastic package decapsulation and glob topping.

Posts

Circuit Edit

Your 1st Silicon Emergency ServiceNanoScope can use FIB (a F...

03/06/2020

X-ray and CSAM imaging of packages

Non-destructive analysis of die inside the plastic package -...

31/05/2020

Package decap and resealing

Open plastic IC's for direct interventions and anlysis, and...

31/05/2020

TEM sample preparation and Extraction

Prepare a TEM foil from a specific location and extract it t...

31/05/2020

Circuit Edit, Device Modification

Direct rewiring of fabricated IC's for proving mask changes...

31/05/2020

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